We have completed the production of an automated inspection system to automatically analyse thin film photovoltaic modules. The system integrates an optical head, which delivers light onto the module, gathers its optical response, and guides the light into different spectroscopic modules for analysis. By means of advanced data processing techniques, this spectral information can be used to assess the quality and efficiency of thin film materials, during the manufacturing process. The early detection of manufacturing defects is of paramount importance to (1) identify manufacturing errors and implement early actions; (2) maximise production yield; (3) ensure the quality and reliability of the modules; and (4) minimise manufacturing waste.
Within the framework of the European research project In4CIS, and following to the design phase, Lenz Instruments has started the manufacturing of an optical inspection system for third generation photovoltaic devices based on CIGS technology.
Within the framework of the European Research project In4CIS, Lenz Instruments has started its design tasks for the optical inspection system for third generation photovoltaic devices based on CIGS technology.
In September 2019, the Research European Project In4CIS was started under the frame of the SOLAR-ERA.NET Cofund 2 program.