IN4CIS – INSPECTION OF THIRD-GENERATION PHOTOVOLTAIC DEVICES
Within the framework of the IN4CIS project, Lenz Instruments has developed a system for the inspection of third-generation photovoltaic devices up to 30×30 millimeters in size. El sistema integra un cabezal multi-sensor compuesto por una sonda Raman y una sonda de fotoluminiscencia.
A control software automatically analyzes the spectral information coming from the sensor head, identifying the presence of microstructural defects in the device materials and automatically rejecting modules that are unsuitable for manufacturing.
Detecting microstructural defects in the early stages of the manufacturing process thus allows for the optimization of production line productivity, while also minimizing the use of material and energy resources.
The system has been installed at the pilot production plant of the ZSW Technology Center (zsw-bw.de) in Stuttgart, Germany. The tests carried out at this center have successfully validated the developed technology. The tests carried out at this center have successfully validated the developed technology.
This project has received funding from ERA-NET Solar Cofund 2, with co-financing from CDTI and the European Union’s Horizon 2020 Framework Programme for Research and Innovation.
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